Syft Technologies designs and manufactures a Selected Ion Flow Tube Mass Spectrometer (SIFT-MS) that enables detection of nearly any volatile compound down to sub-ppbv levels in near-real time. This technique emerged out of investigations of ion chemistry in the Earth’s atmosphere and was developed further at the University of Canterbury in New Zealand. Syft Technologies was formed in 2002 to take this academic research into a fully developed commercial solution. Syft instruments are now sold throughout the world for yield enhancement in a wide range of applications such as food production, pharmaceutical synthesis, and airborne molecular contaminant (AMC) monitoring in semiconductor cleanrooms. In all applications, the unique attributes of SIFT-MS have enabled our customers to measure significantly more than they thought was possible, resulting in a greater understanding of their products and control of their processes.
Syft instruments have been adopted by several semiconductor manufacturers for online monitoring of volatile organic compounds (VOCs) in the cleanroom, bulk gas monitoring, and fenceline monitoring. We have recently introduced the ability to monitor acid gases and other inorganics with the same tool (and analytical technique) as used for VOC monitoring. We are working toward providing the ability to simultaneously monitor all cleanroom relevant AMCs (Refractories, Condensables, Dopants, Molecular Acids and Bases) to low-pptv levels in near-real time.