TestVision 2020 - About Us


Test Vision Steering Committee

Paul Berndt Picture General Chair
Paul Berndt
Principal Test Engineer
Microsoft Corporation


 Amy Gold Picture Marketing & Communications Chair
Amy Gold
Director of Corporate Communications
 Vice General Chair
Derek Floyd
Director of Business Development
Advantest America


 Ken Lanier Picture Sponsoring Chair and SEMICON Exhibit Relations
Ken Lanier
Computing Segment Product Manager
 Program Chair
Heath Noxon
Semiconductor Test Market Development Manager
National Instruments


 Paul Trio Picture Local Arrangement and Registration Chair
Paul Trio
Senior Manager, Strategic Initiatives
 Vice Program Chair
John Shelley
Director, ATE Business Development
 Rikc Marchall Picture Member at Large
Rick Marshall
Director of Sales, Semiconductor & Test
Smiths Interconnect

Benjamin Brown Picture

 Best ATE Paper Award Chair
Benjamin Brown
VP, IC Development & Digital Instruments
Xcerra Corporation


 Stacy Ajouri Picture Member at Large
Stacy Ajouri
Factory Test Solutions
Texas Instruments
Ajay Khoche Picture Member at Large
Ajay Khoche
CEO & President
Smart Connected Systems, Inc.


 Steve Tilden Picture Member at Large
Steve Tilden
Tilden Consulting Corp. 
Amy Leong Picture Member at Large
Amy Leong
Vice President of Marketing
 Dave Armstrong Picture Member at Large
Dave Armstrong
Director of Business Development

Test Vision Program Committee

  • Heath Noxon, National Instruments (Program Chair)
  • John Shelley, Cohu (Vice Program Chair)
  • Travis White, National Instruments
  • Amy Leong, FormFactor
  • Ben Brown, Xcerra Corporation
  • Dave Armstrong, Advantest
  • Matthew Knowles, Mentor Graphics
  • Ken Lanier, Teradyne
  • John Yi, AMD
  • Paul Berndt, Microsoft
  • Phil Nigh, Broadcom
  • Rajiv Roy, FormFactor
  • Rick Marshall, Smiths Interconnect
  • Stacy Ajouri, Texas Instruments
  • Steve Tilden, Tilden Consulting
  • William Urbaniak, Optimal+
  • Paul Trio, SEMI