TestVision 2020 - Award

Best ATE Paper Award

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To spotlight advances in ATE TestVision and the Test Technology Technical Council (TTTC) created the Best ATE Paper Award. The purpose of this award is to single out and publicize the most influential ATE paper of the year to stimulate innovation in the ATE industry. The winner is announced at Test Vision at SEMICON West.

2018 Award Finalists

The finalists for the Best ATE Paper Paper of 2017 are:

  • A Jitter Separation and BER Estimation Method for Asymmetric Total Jitter Distributions, presented at 2017 International Test Conference.  The authors are Masahiro Ishida and Kiyotaka Ichiyama from Advantest Corporation.
  • Low Cost Dynamic Error Detection in Linearity Testing of SAR ADCs, presented at 2017 Interantional Test Conference.  The authors are Nimit Jain from the Indian Institute of Technology and Nitin Agarwal, Rajavelu Thinakaran and Rubin Parekhji from Texas Instruments Corporation.
  • 80+ GHz Low-Loss Transmission from the Tester to the DUT, presented at 2017 Test Vision 2020.  The authors are Sandeep Sankararaman, Don Thompson and Shakeel Siddiqui from R&D Altanova Corporation.

The Best ATE Paper Award Selection Committee appreciates and relies upon inputs from the technical community when naming the Best ATE Paper.  Please vote for your choice and provide the committee with your insights using this survey link.

Test Vision 2020 at SEMICON West 2018 will be held on July 11-12 at the Moscone Center in San Francisco, California.

The recipient(s) of the Best ATE Paper of 2017 award will be announced at the Test Vision 2020 Day 1 session on July 11, 2018.

2017 Award Recipients for Best ATE Paper of 2016:

Jeroen De Coster, Peter De Heyn, Marianna Pantouvaki, Brad Snyder, Hongtao Chen, Erik Jan Marinissen, Philippe Absil, Joris Van Campenhourt, Bryan Bolt
"Test-station For Flexible Semi-Automatic Wafer-Level Silicon Photonics Testing"
Presented at the IEEE European Test Symposium (ETS'16), Amsterdam, the Netherlands, May 2016

Past Award Recipients:

2016: BiTS 2015 - "Designing Sockets for Ludicrous Speed (80 GHz)," Don Thompson and Jose Moreira. The authors showed how they constructed an interface for ATE capable of testing 80 GHz signals.
2015: ITC 2014 - "3A Novel RF Self TEst for a Combo SoC on Digital ATE with Multi-Site Applications,"  CH Peng, et al. The team showed how they used low cost ATE to test an extremely cost sensitive RFIC, while achieving the same bin results as a full performance, high cost ATE System.
2014: ITC 2013 - "30-Gb/s Optical and electrical Test Solution for High-Volume Testing,"  Daisuke Watanabe et al. The first paper presenting an optical-electrical test system suitable for production testing.
2012: I²MTC 2011 - "Reducing THD in an Audio Test Instrument," Sol Max & Richard Liggiero. Awarded for its originality, innovation, intrinsic merit, and effective communication to the audience.
2011: ITC 2010 - "A High Desnity Small Size RF Test Module for High Throughput Multiple Resource Testing"  (slides) the authors did an excellent job of integrating RF test instrumentation to achieve small packaging.  The paper clearly explains the challenges faced, the approaches taken, and the results achieved.  Any ATE engineer interested in building RF instrumentation will find this paper fascinating.

Award Selection Committee

  • Benjamin Brown (Chair), Xcerra
  • Dave Armstrong, Advantest
  • Dr. Erik Larsson, Lund University
  • Dieu Van Dinh, NXP
  • Ken Lanier, Teradyne
  • Professor Gordon Roberts, McGill University
  • Michael Peters, Elmos

The recipient(s) of the Best ATE Paper of 2017 award will be announced at Test Vision 2020 @ SEMICON West 2018.

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